Material-efficient Cu wire-based 3D printing technology

Area Acceleration (D2) Segment Upscaling (D2.2) Duration 2019/01/01-2021/12/31


Industrial Spring 2022

14 kwietnia 2022

Date: 6th of April 2022 Place: Kielce Trade fairs Industrial Spring 2022. Stom-Tool-Blech&Cutting-Laser-Robotics – Fix, Welding, Expo-Surface, Fluid Power, Control…

Visit to ENEA

18 lutego 2022

Date: 19-23th December 2021 Place: Faenza, Italy This visit was connected with delivering the printed prototypes of propellers which underwent…

Formnext 2021

3 grudnia 2021

Date: 15th-18th November 2021 Place: Frankfurt am Main The Formnext Fair is one the most important events connected with Additive…

SITMN Scientific and Technical Conference

3 grudnia 2021

Date: 28th-29th October 2021 Place: Karpacz The 203rd SITMN Scientific and Technical Conference took place on the 28th – 29th…

Warsaw Industry Week

19 listopada 2021

Date: 8th-10th November Place: Warsaw International Trade Fair of Innovative Industrial Solutions – Warsaw Industry Week took place from the…

Workshop Faenza Energy Days

9 listopada 2021

Date: 11th October 2021 Place: Faenza, Italy From the 8th till 14th of October 2021, took place the workshop “Faenza…

Project Partners

Łukasiewicz Research Network - Institute of Non-Ferrous Metals

  • Development of the Cu-based alloys
  • Development of production technology of feedstock materials for WAAM
  • Wire arc additive manufacturing at laboratory scale
  • Materials investigations

Ghent University

  • Corrosion-fatigue investigations
  • Tests of the prototypes in seawater environment
  • Educational activities

Italian National Agency for New Technologies, Energy and Sustainable Economic Development

  • Material investigations
  • Mechanical proporties

Gefertec GmbH

  • Development of the production process parameters by means of 3DMP technology
  • Implementation of the results of the project (end user)
  • Manufacturing of the new products

Tecnalia Research and Innovation

  • Erosion tests
  • Non-destructive tests

Supported by